The article presents a set of equipment designed to diagnose product parameters made using additive technologies. The complex includes an interference microscope, a 3D camera, a 3D scanner and an electronic speckle interferometer, as well as metrological support for these devices in the form of measures and measurement procedures. The advantage of the developed solution is the ability to simulate surface deformation with various physical properties and characteristics.

DOI: 10.22184/1993-7296.FRos.2019.13.6.544.547

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Issue #6/2019
G. N. Vishnyakov, G. G. Levin, V. L. Minaev, A. D. Ivanov
Equipment for Diagnostics of Parameters of Additive Technology Products
The article presents a set of equipment designed to diagnose product parameters made using additive technologies. The complex includes an interference microscope, a 3D camera, a 3D scanner and an electronic speckle interferometer, as well as metrological support for these devices in the form of measures and measurement procedures. The advantage of the developed solution is the ability to simulate surface deformation with various physical properties and characteristics.

DOI: 10.22184/1993-7296.FRos.2019.13.6.544.547
DOI: 10.22184/1993-7296.FRos.2019.13.6.544.547

Equipment for Diagnostics of Parameters of Additive Technology Products

G. N. Vishnyakov, G. G. Levin, V. L. Minaev, A. D. Ivanov
FSUE VNII Optical Physics Measurements, minaev@vniiofi.ru, Moscow, Russia

The article presents a set of equipment designed to diagnose product parameters made using additive technologies. The complex includes an interference microscope, a 3D camera, a 3D scanner and an electronic speckle interferometer, as well as metrological support for these devices in the form of measures and measurement procedures. The advantage of the developed solution is the ability to simulate surface deformation with various physical properties and characteristics.
Key words: metrological support of products made by additive technology, speckle interferometer, calibration of a 3D camera and a 3D scanner
Received: 16.07.2019. Accepted: 04.09.2019.
 
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