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Competent Opinion
M.Mackushin, V.Martinov.
Does Russia Need a Homemade EUV-Nanolithographic system?! State of Art Lithography Technology and Economics The magazine “Photonika” 2010, N1 carried an article of V.Anchutkin, A.Belskyi, O.Gushin “EUV-Nanolithography. Problems and Future Trends”. Authors of this article, that are established authorities, present their view of lithography evolution economic and technologic aspects. Considering their knowledge of the real state of art of technology advancement and the home microelectronics strategic objectives they discuss what lithography does Russian electronics need.
Does Russia Need a Homemade EUV-Nanolithographic system?! State of Art Lithography Technology and Economics The magazine “Photonika” 2010, N1 carried an article of V.Anchutkin, A.Belskyi, O.Gushin “EUV-Nanolithography. Problems and Future Trends”. Authors of this article, that are established authorities, present their view of lithography evolution economic and technologic aspects. Considering their knowledge of the real state of art of technology advancement and the home microelectronics strategic objectives they discuss what lithography does Russian electronics need.
Technologies and Technology Equipment
I.Graph, M.Shakhat.
Power Lasers Optics. Improving Dielectric Coatings Properties Polarizers that can withstand laser radiation high power density need dielectric coatings with special properties. The article considers the advantages and disadvantages of dielectric thin film and multilayer deposition on optical components. It also shows the possibility to produce optional optical parts.
Power Lasers Optics. Improving Dielectric Coatings Properties Polarizers that can withstand laser radiation high power density need dielectric coatings with special properties. The article considers the advantages and disadvantages of dielectric thin film and multilayer deposition on optical components. It also shows the possibility to produce optional optical parts.
Lasers & Laser Systems
S.Andreev, V.Makarov, A.Rukhadze.
S.Andreev, V.Makarov, A.Rukhadze. Ultrastrong Fields Light Pressure and Pondomotered Forces The article considers the effects of all types of modern high power sources and pulse lasers electromagnetic radiation on a substance both when reflected and traversed
S.Andreev, V.Makarov, A.Rukhadze. Ultrastrong Fields Light Pressure and Pondomotered Forces The article considers the effects of all types of modern high power sources and pulse lasers electromagnetic radiation on a substance both when reflected and traversed
Optical Measurements
G.Kokhanenko, M.Makogon.
Fluorescent-Aerosol Lidar “FARAN-M1” Ultraviolet fluorescent-aerosol lidar “FARAN-M1 not only permits to evaluate in-line the atmosphere optical condition at any time round the clock but also to detect biogenic aerosols against the other nature aerosols background. The great possibilities of the device are due to its two channel operation. The UV Channel range of biogenic aerosols coverage amounts 4 km, IF channel along clouds – up to 50 km.
Fluorescent-Aerosol Lidar “FARAN-M1” Ultraviolet fluorescent-aerosol lidar “FARAN-M1 not only permits to evaluate in-line the atmosphere optical condition at any time round the clock but also to detect biogenic aerosols against the other nature aerosols background. The great possibilities of the device are due to its two channel operation. The UV Channel range of biogenic aerosols coverage amounts 4 km, IF channel along clouds – up to 50 km.
I.Ignatiev, A.Loparev, A.Korchak.
3D Laser Surface Analyzers MIM Laser surface analyzers that operate on the basis of Modulation Interference Microscopy (MIM) are promising for semiconductor structures layout non destructive testing because their resolution in the object plane is 10–100 nm and vertically – 0,1 nm. The article concerns the operation fundamentals and performance parameters.
3D Laser Surface Analyzers MIM Laser surface analyzers that operate on the basis of Modulation Interference Microscopy (MIM) are promising for semiconductor structures layout non destructive testing because their resolution in the object plane is 10–100 nm and vertically – 0,1 nm. The article concerns the operation fundamentals and performance parameters.
Tags: defects ic layout surface analyzer
Волоконно-оптические системы связи
S.Kulik.
Quantum Cryptography. Part 3 The outlook conclusion in terms of photon polarization conditions considers the action of the popular quantum cryptography protocol ВВ84
Quantum Cryptography. Part 3 The outlook conclusion in terms of photon polarization conditions considers the action of the popular quantum cryptography protocol ВВ84
A.Gluchenko, L. Gluchenko, V.Tupota.
Estimation of Security of Information that Circulates in Fiber-Optic Communication Links Some unapproved methods of information pickup in fiber-optic communication links segments are insomuch latent that it’s difficult to detect them. This article considers the method of estimation security of information that circulates in the fiber-optic communication link. The heart of this method is information entropy ratio, in other words data throughput reduction ratio of an unapproved channel regarding to fiber-optic communication link transmission rate.
Estimation of Security of Information that Circulates in Fiber-Optic Communication Links Some unapproved methods of information pickup in fiber-optic communication links segments are insomuch latent that it’s difficult to detect them. This article considers the method of estimation security of information that circulates in the fiber-optic communication link. The heart of this method is information entropy ratio, in other words data throughput reduction ratio of an unapproved channel regarding to fiber-optic communication link transmission rate.
Optical measurements
G.Kalenkov, A.Shtanko.
Digital Correlation Speckle Interferometry Using diffusive scattered emission in an optical scheme speckle interferometer as a reference beam noticeably expand the method possibilities. The results of surface microstructure deformation investigation complete the article merit.
Digital Correlation Speckle Interferometry Using diffusive scattered emission in an optical scheme speckle interferometer as a reference beam noticeably expand the method possibilities. The results of surface microstructure deformation investigation complete the article merit.